Iron Speciation Microanalysis: Evaluating Low Overvoltage Wavelength Dispersive Spectrometry Using Natural Reference Materials

Optimization of Wavelength Dispersive X-Ray Spectrometry Analysis Conditions

In setting up the conditions for quantitative wavelength-dispersive electron microprobe analysis a number of parameters have to be defined for each element, namely accelerating voltage, beam current, and (for each element) x-ray line, spectrometer crystal, pulse-height analyser settings, background offsets, and counting times for peak and background. The choices made affect both the reliability...

Microanalysis of Materials Using Synchrotron Radiation

Barriers to Quantitative Electron Probe X-Ray Microanalysis for Low Voltage Scanning Electron Microscopy

Low voltage x-ray microanalysis, defined as being performed with an incident beam energy ≤5 keV, can achieve spatial resolution, laterally and in depth, of 100 nm or less, depending on the exact selection of beam energy and the composition of the target. The shallow depth of beam penetration, with the consequent short path length for x-ray absorption, and the low overvoltage, the ratio of beam ...

X-ray microanalysis of porous materials using Monte Carlo simulations.

Quantitative X-ray microanalysis models, such as ZAF or φ(ρz) methods, are normally based on solid, flat-polished specimens. This limits their use in various domains where porous materials are studied, such as powder metallurgy, catalysts, foams, etc. Previous experimental studies have shown that an increase in porosity leads to a deficit in X-ray emission for various materials, such as graphit...

2-Dimensional beamsteering using dispersive deflectors and wavelength tuning.

We introduce a 2D beamscanner which is controlled by wavelength tuning. Two passive dispersive devices are aligned orthogonally to deflect the optical beam in two dimensions. We provide a proof of principle demonstration by combining an arrayed waveguide grating with a free space optical grating and using various input sources to characterize the beamscanner. This achieved a discrete 10.3 degre...